This study introduces a novel design for a compact, high-precision positioner aimed at improving nanoindentation devices used within Scanning Electron Microscope (SEM) chambers. The new positioner addresses the need for precise positioning with a larger stroke range, enabling deeper single indentations. This eliminates the current necessity for sequential adjustments, which often cause positional errors and unwanted lateral forces. By utilizing an Amplified Piezoelectric Actuator (APA) design, the proposed positioner achieves precise motion with an extended stroke of up to 1 mm, suitable for testing tall or large-scale specimens. This design promises more accurate results in measuring material properties like elasticity, providing valuable insights into nanoscale mechanical behavior. The compact structure of the device makes it ideal for the confined spaces of SEM chambers, facilitating direct observations and advancing research in material science. This new approach is poised to streamline nanoindentation testing, offering a significant improvement over existing methods.
DOI: https://dx.doi.org/10.61927/igmin118
Full Text: https://www.igminresearch.com/articles/html/igmin118
Comments
Post a Comment